Electromigration and associated void formation in silver

Electromigration and associated void formation in silver

Solid State Communications, Vol. 7, pp. i—vu, 1969. Pergamon Press. Printed in Great Britain Abstracts of Articles to be Published in The Journa...

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Solid State Communications,

Vol. 7,

pp. i—vu,

1969.

Pergamon Press.

Printed in Great Britain

Abstracts of Articles to be Published in The Journal of Physics and Chemistry of Solids ~JPhys. Chem. Solids (to be published)’ should be cited in references to material quoted from this section prior to the publication of the relevant article.

1.

ELECTROMIGRATION AND ASSOCIATED VOID FORMATION IN SILVER H.R. Patil and H.B. Huntington, Department of Materials Science and Engineering, Cornell University, Ithaca, New York 14850

Electromigration in both 99.999% pure silver with about 1 ppm oxygen and 99.99% pure silver with about 40 ppm oxygen (presumably in the form of impurity oxides) has been measured using the vacancy flux method. The method consists of determining local volume changes in specimens subjected to a large d.c. current density (~-‘-~ 104A/cm 2) and a parabolic temperature distribution, which results from watercooling the specimen ends. As a result of improved temperature determination, the effective charge for electromigratiori was found to be about — 6.5e in contrast to the earlier reported value of about — 25e. Microscopic void formation on the cathode side and consequent sample elongation were observed only in the less pure silver and could not be induced in the purer material even when charged individually with oxygen or hydrogen. Some evidence indicated oxygen electromigration to the anode in silver and also an enhancement of the seif-electromigration of the latter in the presence of dissolved hydrogen.

Received 26 June 1969 2.

MIGRATION SOUS L’EFFET D’UN CHAMP ELECTRIQUE DE 110Ag ET DE ‘24Sb DANS L’ARGENT

N. Van Doan et G. Brebec, Commissariat l’Energie Atomique, Centre d’Etudes Nucléaires de Saclay, France

a

The most recent theories relative to the influence of anin electric fieldbriefly on therecalled. migrationIn of point defects metals are order to relate the various physical constants of the phenomenon, the flux of a solute is expressed in terms of ‘effective valences’ defined in

Thermodynamics of Irreversibles Processes. Experimental results show that atoms migrate towards the anode with effective valences 124Sb of —16 and —95 respectively for “°Agand at temperatures in the region of 900°C. Estimates were made on the resistivities that should be used in the different theories in order to compare their predictions with experimental results.

Received 24 February 1969 Revised 24 June 1969

3.

UBER DIE PRAPARATION UND DAS SUPRALEITENDE VERHALTEN VON CeRu 2 UND SEINER Gd—, Mn—, Fe—, Co— UND Ni—HALTIGEN MISCHPHASEN M. Wilhelm u. B. Hillenbrand, Aus dem Forschungslaboratorium Erlangen der Siemens AG

Durch geeigriete Glühbehandlung wurden einphasige Proben von CeRu 2 und homogene